Additional Quantinuum Systems configuration¶
- class quantinuum_schemas.models.quantinuum_systems_noise.UserErrorParams(
- *,
- p1: float | None = None,
- p2: float | None = None,
- p_meas: float | Tuple[float, float] | None = None,
- p_init: float | None = None,
- p_crosstalk_meas: float | None = None,
- p_crosstalk_init: float | None = None,
- p1_emission_ratio: float | None = None,
- p2_emission_ratio: float | None = None,
- quadratic_dephasing_rate: float | None = None,
- linear_dephasing_rate: float | None = None,
- coherent_to_incoherent_factor: float | None = None,
- coherent_dephasing: bool | None = None,
- transport_dephasing: bool | None = None,
- idle_dephasing: bool | None = None,
- przz_a: float | None = None,
- przz_b: float | None = None,
- przz_c: float | None = None,
- przz_d: float | None = None,
- przz_power: float | None = None,
- scale: float | None = None,
- p1_scale: float | None = None,
- p2_scale: float | None = None,
- meas_scale: float | None = None,
- init_scale: float | None = None,
- memory_scale: float | None = None,
- emission_scale: float | None = None,
- crosstalk_scale: float | None = None,
- leakage_scale: float | None = None,
User provided error values that override machine values for emulation of Quantinuum Systems hardware.
See the Quantinuum Systems documentation for details of each parameter.
- Args:
p1: Probability of a fault occurring during a 1-qubit gate. p2: Probability of a fault occurring during a 2-qubit gate. p_meas:
Probability of a bit flip being applied to a measurement. Either a float or a tuple of 2 floats. If it is a single float then that error rate is used to bitflip both 0 and 1 measurement results. If a tuple is supplied, the first element is the probability a bit flip is applied if a 0 result occurs during measurement while the second error rate if a 1 is measured.
p_init: Probability of a fault occurring during initialization of a qubit. p_crosstalk_meas: Probability of a crosstalk measurement fault occurring. p_crosstalk_init: Probability of a cross-talk fault occurring during initialization of a
qubit.
- p1_emission_ratio: Fraction of p1 that is spontaneous emission for a single qubit instead
of asymmetric depolarizing noise.
- p2_emission_ratio: Fraction of p2 that is spontaneous emission for a 1- qubit in a 2-qubit
gate instead of asymmetric depolarizing noise.
quadratic_dephasing_rate: The frequency, f, in applying RZ(fd)during transport and idling. linear_dephasing_rate: The probability of applying Z with p=rd where r is rate and
d is duration. This models the memory error. Note both the quadratic and linear term can be applied in the same simulation.
- coherent_to_incoherent_factor: A multiplier on the quadratic term when running stabilizer
simulations to attempt to account for increases in error due to coherent effects in the circuit.
coherent_dephasing: A boolean value determining whether quadratic dephasing is applied. transport_dephasing: A boolean affecting whether memory noise is applied during transport. idle_dephasing: A boolean affecting if memory noise is applied due to qubit idling. przz_a: Parameter a in parameterized angle scaling. See Emulator User Guide for details. przz_b: Parameter b in parameterized angle scaling. See Emulator User Guide for details. przz_c: Parameter c in parameterized angle scaling. See Emulator User Guide for details. przz_d: Parameter d in parameterized angle scaling. See Emulator User Guide for details. przz_power: Polynomial power in parameterized angle scaling. See Emulator User Guide for
details.
scale: Scale all error rates in the model linearly. p1_scale: Scale the probability of a fault occurring during a 1-qubit gate. p2_scale: Scale the probability of a fault occurring during a 2-qubit gate. meas_scale: Scale the probability of a fault occurring during measurement. init_scale: Scale the probability of a fault occurring during initialization of a qubit. memory_scale: Linearly scale the probability of dephasing causing a fault. emission_scale: Scale the probability that a spontaneous emission event happens during a
1- or 2-qubit gate.
- crosstalk_scale: Scale the probability that measurement or initialization crosstalk events
get applied to qubits. During mid-circuit measurement and reset (initialization), crosstalk noise can occur that effectively measures other qubits in the trap or cause them to leak.
- leakage_scale: Scale the probability that a leakage even happens during 1- or 2-qubit
gates as well as during initialization or crosstalk; on the device half the time, spontaneous emission leads to a leakage event.